Comparer des méthodes

	Test de racine unitaire sur panel Im-Pesaran-Shin (IPS)	Test de racine unitaire de panel de Levin-Lin-Chu (LLC)
Domaine	Économétrie	Économétrie
Famille	Hypothesis test	Hypothesis test
Année d'origine	2003	2002
Auteur d'origine	Im, Pesaran & Shin	Andrew Levin, Chien-Fu Lin & Chia-Shang Chu
Type	Panel unit-root test allowing cross-sectional heterogeneity	Panel unit-root test (homogeneous alternative)
Source fondatrice	Im, K. S., Pesaran, M. H., & Shin, Y. (2003). Testing for unit roots in heterogeneous panels. Journal of Econometrics, 115(1), 53–74.	Levin, A., Lin, C.-F., & Chu, C.-S. J. (2002). Unit root tests in panel data: asymptotic and finite-sample properties. Journal of Econometrics, 108(1), 1–24.
Alias	IPS Test, IPS Panel Unit-Root Test, Heterogeneous Panel Unit-Root Test, Im-Pesaran-Shin Birim Kök Testi	LLC Test, Panel Unit-Root Test (Homogeneous), Levin-Lin Unit-Root Test, Panel Birim Kök Testi (LLC)
Apparentées	3	3
Résumé	The Im-Pesaran-Shin (IPS) test, introduced by Im, Pesaran, and Shin in 2003, is a panel unit-root test designed for heterogeneous panels where the autoregressive coefficient is allowed to differ across cross-sectional units. It averages individual Augmented Dickey-Fuller (ADF) t-statistics and constructs a standardized statistic with a standard normal limiting distribution, making it one of the most widely applied first-generation panel unit-root tests in applied econometrics.	The Levin-Lin-Chu (LLC) test, introduced by Levin, Lin, and Chu (2002), is a first-generation panel unit-root test that pools cross-sectional information to test whether all units in a panel share a common autoregressive unit root. It is widely used in applied economics and finance when researchers work with balanced or near-balanced panels and require a powerful test against a homogeneous stationary alternative.