مقایسهٔ روش‌ها

	ساختار لبه جذب پرتو ایکس (XANES)	طیف‌سنجی فروسرخ تبدیل فوریه بازتاب کل تعدیل‌شده (ATR-FTIR)	EXAFS
حوزه	طیف‌سنجی	طیف‌سنجی	طیف‌سنجی
خانواده	Process / pipeline	Process / pipeline	Process / pipeline
سال پیدایش	1975	1961	1971
پدیدآور	Peter Lee	Joop Fahrenfort	Edward Stern
نوع	Synchrotron technique	Vibrational spectroscopy technique	Synchrotron technique
منبع بنیادین	Lee, P. A., & Pendry, J. B. (1975). Theory of extended x-ray absorption fine structure. Physical Review B, 11(8), 2795-2811.	Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155.	Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207.
نام‌های دیگر	XANES spectroscopy, near-edge X-ray absorption	ATR-IR, attenuated total reflectance, FTIR spectroscopy	EXAFS spectroscopy, X-ray absorption spectroscopy
مرتبط	3	3	3
خلاصه	X-ray Absorption Near Edge Structure (XANES) is a synchrotron X-ray spectroscopy technique that measures the electronic and geometric structure around a specific atom by analyzing the X-ray absorption spectrum within about 50 eV of an absorption edge. Developed by Lee and Pendry in 1975, XANES is complementary to EXAFS and reveals valence state, local symmetry, and unoccupied orbital structure through near-threshold features and resonances.	Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation.	Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge.