مقایسهٔ روشها
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| طیفسنجی فروسرخ تبدیل فوریه بازتاب کل تعدیلشده (ATR-FTIR)× | EXAFS× | |
|---|---|---|
| حوزه | طیفسنجی | طیفسنجی |
| خانواده | Process / pipeline | Process / pipeline |
| سال پیدایش≠ | 1961 | 1971 |
| پدیدآور≠ | Joop Fahrenfort | Edward Stern |
| نوع≠ | Vibrational spectroscopy technique | Synchrotron technique |
| منبع بنیادین≠ | Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155. link ↗ | Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207. DOI ↗ |
| نامهای دیگر≠ | ATR-IR, attenuated total reflectance, FTIR spectroscopy | EXAFS spectroscopy, X-ray absorption spectroscopy |
| مرتبط | 3 | 3 |
| خلاصه≠ | Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation. | Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge. |
| ScholarGateمجموعهداده ↗ |
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