مقایسهٔ روش‌ها

	SIBTEST	آزمون تطبیقی رایانه‌ای تشخیصی شناختی	مدل DINA	مدل DINO	تحلیل شرط لازم
حوزه	روان‌سنجی	روان‌سنجی	روان‌سنجی	روان‌سنجی	روان‌سنجی
خانواده	Latent structure	Latent structure	Latent structure	Latent structure	Latent structure
سال پیدایش	1993	2007	2001	2006	2016
پدیدآور	Richard Shealy, William F. Stout	Xueli Xu, Jean-Paul Fox	Brian Junker, Klaas Sijtsma	James Templin, Russell Henson	Jan Dul
نوع	Differential item functioning (DIF) assessment	Skill-adaptive testing with psychometric diagnostic classification	Discrete latent class model	Disjunctive latent class model	Set-theoretic configurational analysis
منبع بنیادین	Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194.	Choi, K. M., Lee, Y. S., & Park, Y. S. (2015). What CDM can tell about examinees' strengths and weaknesses: Cognitive diagnostic information in TIMSS. Journal of Educational Evaluation for Policy Analysis, 24(1), 79-100.	Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272.	Templin, J., & Henson, R. A. (2006). Measurement of psychological disorders using cognitive diagnosis models. Psychological Methods, 11(3), 287-305.	Dul, J. (2016). Necessary Condition Analysis (NCA): Logic and methodology of "necessary but not sufficient" causality. Organizational Research Methods, 19(1), 10-52.
نام‌های دیگر	—	CD-CAT	DINA	DINO	NCA
مرتبط	5	5	4	4	5
خلاصه	SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.	Cognitive Diagnostic Computerized Adaptive Testing (CD-CAT) combines computerized adaptive testing (CAT) with cognitive diagnostic models (CDMs) to efficiently assess students' specific skill profiles. Rather than producing a single overall ability score, CD-CAT adaptively selects items to quickly identify which skills a student has mastered and which need development.	The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips.	The DINO Model (Deterministic Inputs, Noisy Outputs—Disjunctive) is a cognitive diagnostic model that relaxes DINA's conjunctive (AND) skill requirement logic. DINO assumes an examinee only needs to master one of multiple possible skill pathways to answer an item correctly, making it suitable for scenarios where skills are substitutable or alternative routes to success exist.	Necessary Condition Analysis (NCA) is a set-theoretic method developed by Dul (2016) that identifies conditions necessary (but not necessarily sufficient) for an outcome to occur. Unlike regression, which estimates average effects, NCA identifies absolute thresholds: conditions that must be present at a certain level for the outcome to be possible, regardless of other factors.