পদ্ধতির তুলনা করুন

	স্বয়ংক্রিয় পরীক্ষা প্যাটার্ন তৈরি	স্ট্যাটিক টাইমিং অ্যানালাইসিস
ক্ষেত্র	তড়িৎ প্রকৌশল	তড়িৎ প্রকৌশল
পরিবার	Process / pipeline	Process / pipeline
উদ্ভবের বছর	1966	1995
প্রবর্তক	J. Paul Roth	Harish Bhatnagar
ধরন	Automated fault-detection test vector generation	Non-simulation timing verification for digital circuits
মৌলিক উৎস	Abramovici, M., Breuer, M. A., & Friedman, A. D. (1990). Digital Systems Testing and Testable Design. Computer Science Press.	Bhatnagar, H., & Bhatnagar, R. (1995). Static timing analysis: A primer. In VLSI Handbook (pp. 1-25). CRC Press.
অপর নাম	ATPG, Test pattern generation, Fault-based testing	STA, Timing verification, Path-based timing
সম্পর্কিত	3	3
সারসংক্ষেপ	Automatic Test Pattern Generation (ATPG) is the automated creation of test vectors that detect manufacturing defects in digital circuits. Pioneered by Roth in 1966, ATPG systematically finds inputs that make stuck-at faults observable at outputs, enabling comprehensive fault detection. ATPG is critical for semiconductor manufacturing: enabling high test coverage ensures only good chips ship and identifies manufacturing process issues.	Static Timing Analysis (STA) is a non-simulation method for verifying that digital circuits meet timing constraints (clock frequencies, setup/hold times, propagation delays). Introduced systematically by Bhatnagar et al. in the 1990s, STA computes worst-case and best-case path delays by analyzing logic paths without simulating vectors. STA is essential for modern VLSI design, enabling fast timing closure before silicon and identifying critical paths for optimization.