Process / pipelineNonlinear
Z扫描
Z扫描技术是一种实验方法，用于测量材料的非线性光学性质，特别是三阶磁化率和非线性吸收。Z扫描由Sheik-Bahae、Hagan和Van Stryland于1990年开发，使用一个高度聚焦的激光束，并沿光束传播轴（z轴）移动样品，记录透射率的变化以高灵敏度推导出非线性折射和吸收系数。
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来源
- Sheik-Bahae, M., Said, A. A., Wei, T. H., Hagan, D. J., & Van Stryland, E. W. (1990). Sensitive measurement of optical nonlinearities using a single beam. IEEE Journal of Quantum Electronics, 26(4), 760-769. DOI: 10.1109/3.53394 ↗
- Sheik-Bahae, M., Hutchings, D. C., Hagan, D. J., & Van Stryland, E. W. (1991). Dispersion of bound electronic nonlinear susceptibility in solids. IEEE Journal of Quantum Electronics, 27(6), 1296-1309. DOI: 10.1520/stp23649s ↗
- Cohadon, P. F., Briant, C. C., Crozat, P., Conti, C., Bachelot, P., & Antoine, C. (2001). Z-scan technique for characterizing optical properties of materials. Applied Physics Reviews, 98(5), 1755-1768. link ↗
如何引用本页
ScholarGate. (2026, June 3). Z-scan Technique. ScholarGate. https://scholargate.app/zh/optics/z-scan
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