Process / pipelineInstrumental Analysis
CTD剖面测量
电导率-温度-深度(CTD)剖面测量是海洋学中测量海水性质垂直剖面的主要方法。CTD仪器由Neil Brown于1977年开发,配备了电导率、温度和压力(深度)传感器,通常安装在采水罗塞特上。CTD剖面测量提供关键的水文数据,用于表征水团结构、层化和环流模式。
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来源
如何引用本页
ScholarGate. (2026, June 3). Conductivity-Temperature-Depth Profiling. ScholarGate. https://scholargate.app/zh/oceanography/ctd-profiling
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