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CTD剖面测量

电导率-温度-深度(CTD)剖面测量是海洋学中测量海水性质垂直剖面的主要方法。CTD仪器由Neil Brown于1977年开发,配备了电导率、温度和压力(深度)传感器,通常安装在采水罗塞特上。CTD剖面测量提供关键的水文数据,用于表征水团结构、层化和环流模式。

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来源

  1. UNESCO/IOC. (1991). Processing of oceanographic station data. UNESCO Technical Papers in Marine Science, 60. link
  2. Roemmich, D., & Gilson, J. (2009). The 2004-2008 global hydrographic climatology. Oceanography, 22(2), 50-61. link

如何引用本页

ScholarGate. (2026, June 3). Conductivity-Temperature-Depth Profiling. ScholarGate. https://scholargate.app/zh/oceanography/ctd-profiling

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被引用于

ScholarGateCTD Profiling (Conductivity-Temperature-Depth Profiling). 于 2026-06-15 检索自 https://scholargate.app/zh/oceanography/ctd-profiling · 数据集: https://doi.org/10.5281/zenodo.20539026