方法证据记录
Short-form test-retest reliability
Short-form test-retest reliability quantifies how consistently an abbreviated version of a measurement instrument produces the same scores across two administrations separated by a defined time interval. It is a critical validation step whenever a full-length scale is shortened for practical use, confirming that item reduction has not degraded temporal stability.
源记录
引文逐字复制自方法源记录。这些引文不代表任何层级的验证。
Short-form Test-Retest Reliability
分类方法记录 · latent-structure / psychometrics
- Smith, G. T., McCarthy, D. M., & Anderson, K. G. (2000). On the sins of short-form development. Psychological Assessment, 12(1), 102–111. · DOI 10.1037/1040-3590.12.1.102
- Nunnally, J. C., & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. · ISBN 978-0070474659
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