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度量学习×少样本学习×
领域机器学习机器学习
方法族Machine learningMachine learning
起源年份2003 (foundational); refined 2009 (LMNN)2011–2017
提出者Xing, E. P.; Jordan, M. I.; Russell, S.; Ng, A. Y.Lake, B. M.; Vinyals, O.; Finn, C. et al.
类型Representation learning / supervised distance optimizationMeta-learning / low-data learning paradigm
开创性文献Xing, E. P., Jordan, M. I., Russell, S., & Ng, A. Y. (2003). Distance metric learning with application to clustering with side-information. In Advances in Neural Information Processing Systems (NIPS), 16, 505–512. link ↗Vinyals, O., Blundell, C., Lillicrap, T., Wierstra, D., & Kavukcuoglu, K. (2016). Matching Networks for One Shot Learning. Advances in Neural Information Processing Systems (NeurIPS), 29. link ↗
别名Distance Metric Learning, Similarity Learning, DML, Representation Learning via DistanceFSL, low-shot learning, k-shot learning, meta-learning for few examples
相关54
摘要Metric learning is a machine-learning framework that trains a distance or similarity function from data so that semantically similar examples end up close together in the learned space while dissimilar examples are pushed apart. Unlike fixed distances such as Euclidean, the learned metric adapts to the structure of the task, making downstream classifiers, clusterers, and retrieval systems significantly more accurate.Few-shot learning is a machine learning paradigm that trains models to recognize new classes or solve new tasks from only a handful of labeled examples — typically one to five — by leveraging prior knowledge acquired from a large, related training distribution. It is especially relevant in domains where labeling is expensive, scarce, or structurally limited.
ScholarGate数据集
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  3. PUBLISHED

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ScholarGate方法对比: Metric Learning · Few-shot Learning. 于 2026-06-18 检索自 https://scholargate.app/zh/compare