So sánh phương pháp

	Thang đo Căng thẳng Công nghệ (Technostress Scale)	Bảng câu hỏi UTAUT
Lĩnh vực	Hệ thống thông tin	Hệ thống thông tin
Họ	Process / pipeline	Process / pipeline
Năm ra đời	2007	2003
Người khởi xướng	Tarafdar, Tu, Ragu-Nathan	Venkatesh, Morris, Davis & Davis
Loại	Likert-scale stress measure	Likert-scale questionnaire
Công trình gốc	Tarafdar, M., Tu, Q., Ragu-Nathan, B. S., & Ragu-Nathan, T. S. (2007). The impact of technostress on role stress and productivity. Journal of Management Information Systems, 24(1), 301-328.	Venkatesh, V., Morris, M. G., Davis, G. B., & Davis, F. D. (2003). User acceptance and use of information technology: Toward a unified view. MIS Quarterly, 27(3), 425-478.
Tên gọi khác	Techno-stress, Technology-induced stress	UTAUT, Venkatesh UTAUT
Liên quan	4	4
Tóm tắt	The Technostress Scale, developed by Tarafdar, Tu, Ragu-Nathan, and colleagues (2007), measures the stress and negative emotions experienced by employees due to information technology use in the workplace. The scale captures five dimensions of technostress: techno-overload (excessive workload from technology demands), techno-invasion (inability to disconnect from work), techno-complexity (difficulty mastering new technology), techno-insecurity (fear of job loss due to automation), and techno-uncertainty (constant changes in technology). Technostress is linked to decreased productivity, increased burnout, and job dissatisfaction.	The Unified Theory of Acceptance and Use of Technology (UTAUT) was developed by Venkatesh, Morris, Davis, and Davis in 2003 and published in MIS Quarterly. UTAUT integrates insights from eight prior technology acceptance theories into a unified framework, identifying four core constructs—Performance Expectancy, Effort Expectancy, Social Influence, and Facilitating Conditions—that together predict behavioral intention to use and actual technology adoption.