So sánh phương pháp

	Thang đo Căng thẳng Công nghệ (Technostress Scale)	Chỉ số Sẵn sàng Công nghệ
Lĩnh vực	Hệ thống thông tin	Hệ thống thông tin
Họ	Process / pipeline	Process / pipeline
Năm ra đời	2007	2000
Người khởi xướng	Tarafdar, Tu, Ragu-Nathan	Ajay Parasuraman
Loại	Likert-scale stress measure	Likert-scale questionnaire
Công trình gốc	Tarafdar, M., Tu, Q., Ragu-Nathan, B. S., & Ragu-Nathan, T. S. (2007). The impact of technostress on role stress and productivity. Journal of Management Information Systems, 24(1), 301-328.	Parasuraman, A., & Colby, C. L. (2015). An updated and streamlined Technology Readiness Index. Journal of Service Research, 18(1), 59-74.
Tên gọi khác	Techno-stress, Technology-induced stress	TRI, Parasuraman Technology Readiness
Liên quan	4	4
Tóm tắt	The Technostress Scale, developed by Tarafdar, Tu, Ragu-Nathan, and colleagues (2007), measures the stress and negative emotions experienced by employees due to information technology use in the workplace. The scale captures five dimensions of technostress: techno-overload (excessive workload from technology demands), techno-invasion (inability to disconnect from work), techno-complexity (difficulty mastering new technology), techno-insecurity (fear of job loss due to automation), and techno-uncertainty (constant changes in technology). Technostress is linked to decreased productivity, increased burnout, and job dissatisfaction.	The Technology Readiness Index (TRI) was developed by Ajay Parasuraman in 2000 to measure individual propensity to adopt and use new technologies. The TRI assesses a person's personal attitudes toward technology across four dimensions: optimism, innovativeness, discomfort, and insecurity. Updated in 2015 with a streamlined 16-item version, the TRI helps identify technology adopter segments and predict behavior across diverse technology contexts.