So sánh phương pháp
Xem các phương pháp đã chọn cạnh nhau; những hàng khác biệt được làm nổi bật.
| EXAFS× | ATR-FTIR× | |
|---|---|---|
| Lĩnh vực | Quang phổ học | Quang phổ học |
| Họ | Process / pipeline | Process / pipeline |
| Năm ra đời≠ | 1971 | 1961 |
| Người khởi xướng≠ | Edward Stern | Joop Fahrenfort |
| Loại≠ | Synchrotron technique | Vibrational spectroscopy technique |
| Công trình gốc≠ | Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207. DOI ↗ | Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155. link ↗ |
| Tên gọi khác≠ | EXAFS spectroscopy, X-ray absorption spectroscopy | ATR-IR, attenuated total reflectance, FTIR spectroscopy |
| Liên quan | 3 | 3 |
| Tóm tắt≠ | Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge. | Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation. |
| ScholarGateBộ dữ liệu ↗ |
|
|