So sánh phương pháp

	Tán xạ ánh sáng động	Phân tích nhiệt trọng lượng	Tinh luyện Rietveld bằng nhiễu xạ tia X (XRD)
Lĩnh vực	Khoa học vật liệu	Khoa học vật liệu	Khoa học vật liệu
Họ	Process / pipeline	Process / pipeline	Process / pipeline
Năm ra đời	1964	1960s	1969
Người khởi xướng	Robert Pecora	William W. Wendlandt	Hugo Rietveld
Loại	Measurement method	Characterization method	Refinement method
Công trình gốc	Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070.	Wendlandt, W. W. (1986). Thermal Analysis (3rd ed.). John Wiley & Sons.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
Tên gọi khác	DLS, photon correlation spectroscopy, particle size measurement	TGA, thermal gravimetry, thermogravimetry	Rietveld refinement, powder diffraction refinement
Liên quan	3	3	3
Tóm tắt	Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.	Thermogravimetric Analysis (TGA) is a thermal characterization technique that continuously measures mass loss or gain of a material as a function of temperature (or time at constant temperature). Developed systematically by William Wendlandt and colleagues in the 1960s, TGA identifies thermal transitions (evaporation, decomposition, oxidation, reduction) and quantifies composition of polymers, pharmaceuticals, ceramics, and other materials. The derivative signal (DTG) highlights transition temperatures. When combined with gas analysis (MS, FTIR), decomposition products are identified.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.