Порівняння методів

	Patent Analysis	Technology Delphi
Галузь	Science Technology Studies	Science Technology Studies
Родина	Process / pipeline	Process / pipeline
Рік появи	1994	1975
Автор методу	Francis Narin (patent bibliometrics) and the patent-analytics community	Helmer & Dalkey (RAND); national applications by NISTEP (Japan) and Cuhls (Germany)
Тип	Document-based technological-intelligence process	Iterative structured expert-survey process
Основоположне джерело	Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155.	Linstone, H. A., & Turoff, M. (Eds.). (1975). The Delphi Method: Techniques and Applications. Addison-Wesley. ISBN: 9780201042948
Інші назви	Patent analytics, Patent bibliometrics, Patent landscaping	Technology Delphi survey, Foresight Delphi, National Delphi forecast
Пов'язані	4	4
Підсумок	Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.	The technology Delphi is a large-scale, multi-round expert survey used to forecast the timing, importance, and feasibility of future technological developments. Built on the classic Delphi principles of anonymity, iteration, controlled feedback, and statistical aggregation, it elicits judgements from hundreds or thousands of experts on a structured list of technology statements and converges them, round by round, into a collective forecast that informs national and organisational science and technology priorities.