Порівняння методів
Переглядайте обрані методи поруч; рядки з відмінностями підсвічено.
| Horizon Scanning× | Patent Analysis× | |
|---|---|---|
| Галузь | Science Technology Studies | Science Technology Studies |
| Родина | Process / pipeline | Process / pipeline |
| Рік появи≠ | 2009 | 1994 |
| Автор методу≠ | William J. Sutherland, Effie Amanatidou, and the foresight/scanning community | Francis Narin (patent bibliometrics) and the patent-analytics community |
| Тип≠ | Systematic search-and-detection process | Document-based technological-intelligence process |
| Основоположне джерело≠ | Sutherland, W. J., & Woodroof, H. J. (2009). The need for environmental horizon scanning. Trends in Ecology & Evolution, 24(10), 523-527. DOI ↗ | Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155. DOI ↗ |
| Інші назви | Environmental scanning, Weak-signal detection, Emerging-issues analysis | Patent analytics, Patent bibliometrics, Patent landscaping |
| Пов'язані | 4 | 4 |
| Підсумок≠ | Horizon scanning is the systematic examination of information to detect early signs of potentially important developments—weak signals, emerging issues, and wild cards—before they become obvious or fully formed. By surveying a wide range of sources at the edge of current attention, it gives decision-makers advance warning of opportunities and threats and supplies the raw material for foresight, scenario building, and anticipatory policy. | Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight. |
| ScholarGateНабір даних ↗ |
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