เปรียบเทียบวิธี

	Horizon Scanning	Patent Analysis
สาขาวิชา	Science Technology Studies	Science Technology Studies
ตระกูล	Process / pipeline	Process / pipeline
ปีกำเนิด	2009	1994
ผู้ริเริ่ม	William J. Sutherland, Effie Amanatidou, and the foresight/scanning community	Francis Narin (patent bibliometrics) and the patent-analytics community
ประเภท	Systematic search-and-detection process	Document-based technological-intelligence process
แหล่งต้นตำรับ	Sutherland, W. J., & Woodroof, H. J. (2009). The need for environmental horizon scanning. Trends in Ecology & Evolution, 24(10), 523-527.	Narin, F. (1994). Patent bibliometrics. Scientometrics, 30(1), 147-155.
ชื่อเรียกอื่น	Environmental scanning, Weak-signal detection, Emerging-issues analysis	Patent analytics, Patent bibliometrics, Patent landscaping
ที่เกี่ยวข้อง	4	4
สรุป	Horizon scanning is the systematic examination of information to detect early signs of potentially important developments—weak signals, emerging issues, and wild cards—before they become obvious or fully formed. By surveying a wide range of sources at the edge of current attention, it gives decision-makers advance warning of opportunities and threats and supplies the raw material for foresight, scenario building, and anticipatory policy.	Patent analysis, or patanalytics, mines the documents and metadata in patent databases to generate technological intelligence. Because patents are structured, dated, classified, and citation-linked records of inventive activity, analysing patent counts, citations, classification codes, applicants, and text reveals who is innovating where, in which technologies, how fields connect, and how the technological landscape is shifting—evidence that feeds competitive intelligence, R&D strategy, and foresight.