เปรียบเทียบวิธี

	Differential Item Functioning in Educational Testing	Differential Item Functioning (DIF)
สาขาวิชา	Education	การวัดทางจิตวิทยา
ตระกูล	Latent structure	Latent structure
ปีกำเนิด	1993	1970s–1993
ผู้ริเริ่ม	Educational measurement / test-fairness tradition (Holland, Wainer, Dorans, Thissen)	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
ประเภท	Test-fairness analysis detecting items that function differently across groups	Item-level bias detection
แหล่งต้นตำรับ	Holland, P. W., & Wainer, H. (Eds.). (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 9780805809725	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
ชื่อเรียกอื่น	Educational DIF Analysis, Item Bias Detection in Tests, Test Fairness DIF, Mantel-Haenszel DIF	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias
ที่เกี่ยวข้อง	4	5
สรุป	Differential item functioning (DIF) analysis is the central statistical tool for evaluating the fairness of test items in education. An item shows DIF when examinees of equal ability but different group membership — for example by gender, race/ethnicity, or language background — have unequal probabilities of answering it correctly. By conditioning on ability before comparing groups, DIF analysis separates genuine item bias from real group differences in proficiency, and flags items for expert review before they affect high-stakes decisions.	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.