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Atomic Force Microscopy/Ushahidi
Rekodi ya ushahidi wa mbinu

Atomic Force Microscopy

Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.

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Atomic Force Microscopy (AFM)
Rekodi ya mbinu ya kiajenda · process-pipeline / materials-science
  • Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933. · DOI 10.1103/PhysRevLett.56.930
  • Eaton, P., & West, P. (2005). Atomic Force Microscopy. Oxford University Press. · URL
  • Butt, H. J., Cappella, B., & Kappl, M. (2005). Force measurements with the atomic force microscope: Technique, interpretation and applications. Surface Science Reports, 59(1-6), 1-152. · DOI 10.1016/j.surfrep.2005.08.003
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Same method familyEnergy-Dispersive X-ray Spectroscopymachine-suggested · Relational suggestion, not evidence.Same method familyNanoindentationmachine-suggested · Relational suggestion, not evidence.Same method familySelected Area Electron Diffractionmachine-suggested · Relational suggestion, not evidence.

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