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| Mfumo mfupi wa Rasch× | Kufanya Kazi Tofauti kwa Vipengele (DIF)× | |
|---|---|---|
| Nyanja | Saikometriki | Saikometriki |
| Familia | Latent structure | Latent structure |
| Mwaka wa asili≠ | 1960 (Rasch model); short-form application from 1980s onward | 1970s–1993 |
| Mwanzilishi≠ | Georg Rasch | William H. Angoff and colleagues (ETS); systematized by Holland & Wainer |
| Aina≠ | Probabilistic item response model | Item-level bias detection |
| Chanzo asilia≠ | Rasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut. link ↗ | Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589 |
| Majina mbadala≠ | Rasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch model | DIF, item bias analysis, measurement non-equivalence, item-level measurement bias |
| Zinazohusiana≠ | 6 | 5 |
| Muhtasari≠ | The short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items. | Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development. |
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