Linganisha mbinu

	Kufanya Kazi Tofauti kwa Vipengele (DIF)	Mofumo wa Rasch
Nyanja	Saikometriki	Saikometriki
Familia	Latent structure	Latent structure
Mwaka wa asili	1970s–1993	1960
Mwanzilishi	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer	Georg Rasch
Aina	Item-level bias detection	Item Response Theory / Latent trait model
Chanzo asilia	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
Majina mbadala	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
Zinazohusiana	5	6
Muhtasari	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.