Linganisha mbinu
Pitia mbinu ulizochagua bega kwa bega; safu zinazotofautiana zinaangaziwa.
| Chati ya Udhibiti wa CUSUM× | Chati za Kudhibiti Sifa (p, np, c, u)× | |
|---|---|---|
| Nyanja | Takwimu | Takwimu |
| Familia | Process / pipeline | Process / pipeline |
| Mwaka wa asili≠ | 1954 | 1931 |
| Mwanzilishi≠ | E. S. Page | Walter A. Shewhart |
| Aina≠ | Statistical process control chart for small shifts | Statistical process control charts for count/proportion data |
| Chanzo asilia≠ | Page, E. S. (1954). Continuous inspection schemes. Biometrika, 41(1/2), 100–115. DOI ↗ | Shewhart, W. A. (1931). Economic Control of Quality of Manufactured Product. D. Van Nostrand Company. ISBN: 978-0-87389-076-2 |
| Majina mbadala≠ | cumulative sum chart, CUSUM control chart, Page's CUSUM, kümülatif toplam kontrol kartı | p-chart, np-chart, c-chart, u-chart |
| Zinazohusiana | 4 | 4 |
| Muhtasari≠ | The cumulative sum (CUSUM) control chart, introduced by E. S. Page in 1954, monitors a process by accumulating the deviations of observations from a target value rather than judging each point in isolation. Because small persistent shifts add up over time, the running sum makes them visible far sooner than a Shewhart chart, making CUSUM the tool of choice for detecting small, sustained changes in the process mean. | Attributes control charts extend Shewhart's framework to count and proportion data — quality characteristics that are classified rather than measured. The p- and np-charts monitor the proportion or number of defective items using the binomial distribution, while the c- and u-charts monitor the number of defects per unit using the Poisson distribution. They are the standard statistical-process-control tools when inspection yields pass/fail or defect counts rather than continuous measurements. |
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