Linganisha mbinu

	Upimaji Adaptive wa Kompyuta kwa kutumia Model ya Rasch (CAT-Rasch)	Mofumo wa Rasch
Nyanja	Saikometriki	Saikometriki
Familia	Latent structure	Latent structure
Mwaka wa asili	1960 (Rasch model); CAT integration from 1970s onward	1960
Mwanzilishi	Georg Rasch (measurement model); adaptive testing formalized by Wainer, van der Linden, and others	Georg Rasch
Aina	Adaptive psychometric measurement	Item Response Theory / Latent trait model
Chanzo asilia	Wainer, H. (Ed.). (2000). Computerized Adaptive Testing: A Primer (2nd ed.). Lawrence Erlbaum Associates. ISBN: 978-0805835113	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
Majina mbadala	CAT-Rasch, Rasch-based CAT, adaptive Rasch testing, computerized adaptive measurement	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
Zinazohusiana	5	6
Muhtasari	Computerized adaptive testing with the Rasch model selects items in real time based on each examinee's evolving ability estimate, so that every person receives a test precisely calibrated to their proficiency level. The result is a shorter, more efficient measurement instrument that loses none of the precision of a full-length fixed-form test.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.