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Process / pipelineAccelerated life testing

Visoko ubrzano ispitivanje trajnosti (HALT)

Visoko ubrzano ispitivanje trajnosti (HALT) je metodologija za brzo identifikovanje slabosti dizajna i određivanje margine između normalnih radnih uslova i otkaza proizvoda. Primenom ekstremnih, ali nedestruktivnih stres profila (termalnih, vibracionih, itd.), HALT ubrzava „sat otkaza“ kako bi otkrio latentne defekte za nekoliko nedelja, umesto za nekoliko godina. Intenzivno razvijan od 1980-ih pa nadalje i usavršen od strane praktičara u elektronici i mehaničkim sistemima, HALT je postao esencijalan u ubrzanom razvoju proizvoda i validaciji pouzdanosti.

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Izvori

  1. Leis, B. N., & Stephens, D. R. (2011). Reliability methodologies for structural integrity assessment. Journal of Pressure Vessel Technology, 133(5), 051204. link
  2. Nelson, W. B. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analyses. Wiley. link
  3. Hobbs, G. K. (1997). Physical Modeling of Electronic Products for Reliability and Shelf Life. IEEE Transactions on Components, Packaging, and Manufacturing Technology, 20(2), 82-95. link
  4. Alfirevic, D., Callerame, F., & Roberts, G. (2011). A comprehensive overview of HALT and HASS. Proceedings of the EPTC 2011. link

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ScholarGate. (2026, June 3). Highly Accelerated Life Testing (HALT). ScholarGate. https://scholargate.app/sr/reliability-engineering/highly-accelerated-life-testing

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ScholarGateHighly Accelerated Life Testing (Highly Accelerated Life Testing (HALT)). Preuzeto 2026-06-15 sa https://scholargate.app/sr/reliability-engineering/highly-accelerated-life-testing · Skup podataka: https://doi.org/10.5281/zenodo.20539026