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Z-scan×Fourierova optika×
OdborOptikaOptika
RodinaProcess / pipelineProcess / pipeline
Rok vzniku19901822
TvorcaMansoor Sheik-Bahae, David Hagan, and Eric Van StrylandJoseph Fourier and Ernst Abbe
TypMeasurement techniqueSpectral decomposition method
Pôvodný zdrojSheik-Bahae, M., Said, A. A., Wei, T. H., Hagan, D. J., & Van Stryland, E. W. (1990). Sensitive measurement of optical nonlinearities using a single beam. IEEE Journal of Quantum Electronics, 26(4), 760-769. DOI ↗Goodman, J. W. (1968). Introduction to Fourier Optics. McGraw-Hill. link ↗
Ďalšie názvyZ-scan method, nonlinear refraction measurementfrequency-domain optics, wave optics, diffraction theory
Príbuzné33
ZhrnutieThe Z-scan technique is an experimental method for measuring nonlinear optical properties of materials, particularly third-order susceptibility and nonlinear absorption. Developed by Sheik-Bahae, Hagan, and Van Stryland in 1990, Z-scan uses a tightly focused laser beam and moves the sample along the beam propagation axis (z-axis), recording transmission variation to deduce nonlinear refraction and absorption coefficients with high sensitivity.Fourier optics is a mathematical framework that analyzes optical systems and phenomena using Fourier transforms and frequency-domain methods. Grounded in Joseph Fourier's 1822 work on heat diffusion and Ernst Abbe's microscopy theory, this approach decomposes optical fields into plane waves or spatial frequencies, revealing how optical systems manipulate and filter these components to produce images and transmit information.
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ScholarGatePorovnať metódy: Z-scan · Fourier Optics. Získané 2026-06-17 z https://scholargate.app/sk/compare