Porovnať metódy

	Dynamické rozptylové svetlo	Atomárna silová mikroskopia	Termogravimetrická analýza
Odbor	Materiálová veda	Materiálová veda	Materiálová veda
Rodina	Process / pipeline	Process / pipeline	Process / pipeline
Rok vzniku	1964	1986	1960s
Tvorca	Robert Pecora	Gerd Binnig	William W. Wendlandt
Typ	Measurement method	Imaging technique	Characterization method
Pôvodný zdroj	Pecora, R. (1964). Spectral distribution of scattered light from a suspension of particles. Physica, 30(11), 2055-2070.	Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933.	Wendlandt, W. W. (1986). Thermal Analysis (3rd ed.). John Wiley & Sons.
Ďalšie názvy	DLS, photon correlation spectroscopy, particle size measurement	AFM, scanning probe microscopy, nanoindentation microscopy	TGA, thermal gravimetry, thermogravimetry
Príbuzné	3	3	3
Zhrnutie	Dynamic Light Scattering (DLS), also known as Photon Correlation Spectroscopy (PCS), is an analytical technique for determining the size and size distribution of particles suspended in fluids by analyzing the time-dependent intensity fluctuations of scattered laser light. Developed by Robert Pecora in 1964, DLS exploits the Brownian motion of particles: smaller particles move faster, causing faster intensity fluctuations; larger particles move slower, causing slower fluctuations. By correlating intensity over time, particle size is deduced. DLS is rapid, non-destructive, and requires minimal sample volume, making it the standard technique for characterizing nanoparticles, proteins, colloids, and emulsions.	Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties.	Thermogravimetric Analysis (TGA) is a thermal characterization technique that continuously measures mass loss or gain of a material as a function of temperature (or time at constant temperature). Developed systematically by William Wendlandt and colleagues in the 1960s, TGA identifies thermal transitions (evaporation, decomposition, oxidation, reduction) and quantifies composition of polymers, pharmaceuticals, ceramics, and other materials. The derivative signal (DTG) highlights transition temperatures. When combined with gas analysis (MS, FTIR), decomposition products are identified.