Сравнение методов
Просматривайте выбранные методы рядом; строки с различиями подсвечены.
| Твердость по Виккерсу× | Атомно-силовая микроскопия× | |
|---|---|---|
| Область | Материаловедение | Материаловедение |
| Семейство | Process / pipeline | Process / pipeline |
| Год появления≠ | 1922 | 1986 |
| Автор метода≠ | Smith and Sandland | Gerd Binnig |
| Тип≠ | Hardness test | Imaging technique |
| Основополагающий источник≠ | Smith, E., & Sandland, G. E. (1922). An accurate method of determining the hardness of metals with particular reference to high-hardness alloys. The Institution of Steel Engineers, 8, 623-641. link ↗ | Binnig, G., Quate, C. F., & Gerber, C. (1986). Atomic force microscope. Physical Review Letters, 56(9), 930-933. DOI ↗ |
| Другие названия | Vickers hardness test, Vickers microhardness, HV | AFM, scanning probe microscopy, nanoindentation microscopy |
| Связанные | 3 | 3 |
| Сводка≠ | Vickers Hardness testing is a mechanical characterization technique for determining material hardness by pressing a diamond pyramid indenter into a material surface under controlled load and measuring the resulting indent dimensions. Invented by Smith and Sandland in 1922, Vickers hardness is applicable across an enormous hardness range (1-2000 HV) using the same indenter geometry at different loads. It is the most versatile hardness test, widely used in materials science, metallurgy, and quality control for assessing material strength and comparing alloy performance. | Atomic Force Microscopy (AFM) is a scanning probe technique that measures nanoscale surface topography and mechanical properties by monitoring interactions between a sharp cantilever tip and a sample surface. Invented by Gerd Binnig in 1986 as an extension of scanning tunneling microscopy, AFM requires neither electrical conductivity nor vacuum operation, making it applicable to virtually any material. It provides three-dimensional topographic maps with sub-nanometer vertical resolution and lateral resolution approaching nanometers, along with simultaneous measurements of mechanical, electrical, and chemical properties. |
| ScholarGateНабор данных ↗ |
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