ScholarGate
Asistent

Compară metode

Examinează metodele selectate una lângă alta; rândurile care diferă sunt evidențiate.

SIBTEST×Modelul DINO×
DomeniuPsihometriePsihometrie
FamilieLatent structureLatent structure
Anul apariției19932006
Autorul originalRichard Shealy, William F. StoutJames Templin, Russell Henson
TipDifferential item functioning (DIF) assessmentDisjunctive latent class model
Sursa seminalăShealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Templin, J., & Henson, R. A. (2006). Measurement of psychological disorders using cognitive diagnosis models. Psychological Methods, 11(3), 287-305. DOI ↗
Denumiri alternativeDINO
Înrudite54
RezumatSIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.The DINO Model (Deterministic Inputs, Noisy Outputs—Disjunctive) is a cognitive diagnostic model that relaxes DINA's conjunctive (AND) skill requirement logic. DINO assumes an examinee only needs to master one of multiple possible skill pathways to answer an item correctly, making it suitable for scenarios where skills are substitutable or alternative routes to success exist.
ScholarGateSet de date
  1. v1
  2. 3 Surse
  3. PUBLISHED
  1. v1
  2. 3 Surse
  3. PUBLISHED

Mergi la căutare Descarcă prezentarea

ScholarGateCompară metode: SIBTEST · DINO Model. Preluat la 2026-06-17 de pe https://scholargate.app/ro/compare