Comparar métodos

	Teste Log-Rank para Comparação de Curvas de Sobrevivência	Estimador de Sobrevivência de Kaplan-Meier	Estimador de Risco Cumulativo de Nelson-Aalen
Área	Análise de sobrevivência	Análise de sobrevivência	Análise de sobrevivência
Família	Survival analysis	Survival analysis	Survival analysis
Ano de origem	1966	1958	1972
Autor original	Mantel, N.	Kaplan, E. L. & Meier, P.	Wayne Nelson & Odd Aalen
Tipo	Non-parametric hypothesis test	Non-parametric survival estimator	Non-parametric cumulative hazard estimator
Fonte seminal	Mantel, N. (1966). Evaluation of Survival Data and Two New Rank Order Statistics Arising in Its Consideration. Cancer Chemotherapy Reports, 50(3), 163–170.	Kaplan, E. L. & Meier, P. (1958). Nonparametric Estimation from Incomplete Observations. Journal of the American Statistical Association, 53(282), 457–481.	Nelson, W. (1972). Theory and applications of hazard plotting for censored failure data. Technometrics, 14(4), 945–966.
Outros nomes	Mantel log-rank test, Mantel-Cox test, log-rank sağkalım testi, Log-Rank Testi	product-limit estimator, km curve, kaplan-meier sağkalım analizi	Nelson-Aalen cumulative hazard, Aalen estimator, empirical cumulative hazard, Nelson-Aalen kümülatif hazard tahmincisi
Relacionados	2	2	5
Resumo	The log-rank test, developed by Nathan Mantel in 1966, is a non-parametric hypothesis test that compares the overall survival experience of two or more groups throughout the entire follow-up period. It is the standard companion to Kaplan-Meier curves and determines whether observed differences between curves are statistically meaningful.	The Kaplan-Meier estimator, introduced by Kaplan and Meier in 1958, is a non-parametric method that estimates the survival curve — the probability of remaining event-free over time — from right-censored time-to-event data. The log-rank test is the companion procedure used to compare survival curves between groups.	The Nelson-Aalen estimator is a non-parametric estimator of the cumulative hazard function from right-censored time-to-event data. Developed by Wayne Nelson for reliability hazard plotting in 1972 and placed on a rigorous counting-process foundation by Odd Aalen in 1978, it accumulates the ratio of observed events to the number at risk at each event time, providing the natural hazard-scale companion to the Kaplan-Meier survival curve.