Porównaj metody
Przeglądaj wybrane metody obok siebie; wiersze, które się różnią, są wyróżnione.
| SIBTEST× | Model DINA× | |
|---|---|---|
| Dziedzina | Psychometria | Psychometria |
| Rodzina | Latent structure | Latent structure |
| Rok powstania≠ | 1993 | 2001 |
| Twórca≠ | Richard Shealy, William F. Stout | Brian Junker, Klaas Sijtsma |
| Typ≠ | Differential item functioning (DIF) assessment | Discrete latent class model |
| Źródło pierwotne≠ | Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗ | Junker, B. W., & Sijtsma, K. (2001). Cognitive assessment models with few assumptions, and connections with nonparametric item response theory. Applied Psychological Measurement, 25(3), 258-272. DOI ↗ |
| Inne nazwy≠ | — | DINA |
| Pokrewne≠ | 5 | 4 |
| Podsumowanie≠ | SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability. | The DINA Model (Deterministic Inputs, Noisy Outputs) is a cognitive diagnostic model developed by Junker and Sijtsma (2001) that classifies examinees into latent skill classes based on their item response patterns. DINA assumes a deterministic relationship between skill mastery and correct responses, with probabilistic error accounting for guessing and slips. |
| ScholarGateZbiór danych ↗ |
|
|