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Analiza pozycji porządkowych×Różnicowe funkcjonowanie pozycji testowej (DIF)×
DziedzinaPsychometriaPsychometria
RodzinaLatent structureLatent structure
Rok powstania1950s–1980s1970s–1993
TwórcaClassical test theory tradition (Guilford, Nunnally, and others)William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
TypItem-level diagnosticItem-level bias detection
Źródło pierwotneNunnally, J. C. & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. ISBN: 978-0070474659Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
Inne nazwyitem analysis for ordinal data, polytomous item analysis, Likert item analysis, OIADIF, item bias analysis, measurement non-equivalence, item-level measurement bias
Pokrewne65
PodsumowanieOrdinal item analysis evaluates each individual item in a rating-scale or Likert-type instrument using descriptive and correlational statistics suited to ordered categorical response formats. It guides item selection and refinement by flagging items with problematic difficulty, poor discrimination, or low corrected item-total correlations before reliability and validity studies proceed.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGatePorównaj metody: Ordinal Item Analysis · Differential Item Functioning. Pobrano 2026-06-17 z https://scholargate.app/pl/compare