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Kortform Rasch-modell×Differensiert varefunksjonering (DIF)×
FagfeltPsykometriPsykometri
FamilieLatent structureLatent structure
Opprinnelsesår1960 (Rasch model); short-form application from 1980s onward1970s–1993
OpphavspersonGeorg RaschWilliam H. Angoff and colleagues (ETS); systematized by Holland & Wainer
TypeProbabilistic item response modelItem-level bias detection
Opprinnelig kildeRasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut. link ↗Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
AliasRasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch modelDIF, item bias analysis, measurement non-equivalence, item-level measurement bias
Relaterte65
SammendragThe short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGateSammenlign metoder: Short form Rasch model · Differential Item Functioning. Hentet 2026-06-17 fra https://scholargate.app/no/compare