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| Analisis Fungsi Item Pembezaan Bentuk Pendek (Short-Form DIF)× | Fungsi Item Berbeza (DIF)× | |
|---|---|---|
| Bidang | Psikometrik | Psikometrik |
| Keluarga | Latent structure | Latent structure |
| Tahun asal≠ | 1970s–1990s (DIF); short-form context developed in parallel with scale abbreviation literature | 1970s–1993 |
| Pengasas≠ | Angoff, W. H. and subsequent DIF methodologists | William H. Angoff and colleagues (ETS); systematized by Holland & Wainer |
| Jenis≠ | Item bias / measurement fairness analysis | Item-level bias detection |
| Sumber perintis≠ | Millsap, R. E. (2012). Statistical Approaches to Measurement Invariance. Routledge. ISBN: 978-0-8058-4507-0 | Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589 |
| Alias | Short-form DIF, abbreviated scale DIF, DIF in short forms, short-scale DIF detection | DIF, item bias analysis, measurement non-equivalence, item-level measurement bias |
| Berkaitan≠ | 6 | 5 |
| Ringkasan≠ | Short-form differential item functioning (DIF) analysis examines whether individual items in an abbreviated scale function equivalently across demographic or subgroup comparisons. When a scale is shortened, retained items must still behave fairly for all relevant groups — DIF analysis verifies this, ensuring that score differences reflect true ability or trait differences rather than item bias. | Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development. |
| ScholarGateSet data ↗ |
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