Bandingkan kaedah
Semak kaedah pilihan anda secara bersebelahan; baris yang berbeza akan diserlahkan.
| Analisis Fungsi Item Berbeza (DIF)× | Item Analysis× | |
|---|---|---|
| Bidang | Psikometrik | Psikometrik |
| Keluarga | Latent structure | Latent structure |
| Tahun asal≠ | 1988 | 1979 |
| Pengasas≠ | Paul W. Holland & Dorothy T. Thayer (Mantel-Haenszel approach, 1988) | Classical Test Theory tradition; foundational texts by Allen & Yen (1979) and Crocker & Algina (1986) |
| Jenis≠ | Item-level fairness / measurement equivalence analysis | Descriptive / psychometric screening |
| Sumber perintis≠ | Holland, P. W. & Thayer, D. T. (1988). Differential Item Performance and the Mantel-Haenszel Procedure. ETS Research Report Series. link ↗ | Allen, M. J. & Yen, W. M. (1979). Introduction to Measurement Theory. Brooks/Cole. ISBN: 978-0818501333 |
| Alias≠ | Madde Yanlılık Analizi (DIF — Differential Item Functioning), item bias analysis, Mantel-Haenszel DIF, Lord chi-square DIF | Madde Analizi (Klasik Test Kuramı), CTT item analysis, classical item analysis |
| Berkaitan≠ | 4 | 5 |
| Ringkasan≠ | Differential Item Functioning analysis examines whether examinees from different groups — such as gender, ethnicity, or language background — who have the same underlying ability respond differently to a test item. First formalised by Holland and Thayer in 1988 via the Mantel-Haenszel procedure, it is the principal tool in modern test development for detecting and removing item bias. | Item analysis is the foundational psychometric procedure for evaluating the quality of individual test or scale items within the Classical Test Theory (CTT) framework, as systematised by Allen and Yen (1979) and Crocker and Algina (1986). It produces an item difficulty index, an item discrimination index, and a distractor analysis for each item, enabling test developers to identify items that are too easy, too hard, or failing to separate high- and low-ability respondents. |
| ScholarGateSet data ↗ |
|
|