手法を比較

	ショートフォーム・ラッシュモデル	測定不変性テスト
分野	心理測定学	心理測定学
系統	Latent structure	Latent structure
提唱年	1960 (Rasch model); short-form application from 1980s onward	2000
提唱者	Georg Rasch	Vandenberg & Lance
種類	Probabilistic item response model	Multi-group confirmatory factor analysis procedure
原典	Rasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut.	Vandenberg, R. J., & Lance, C. E. (2000). A review and synthesis of the measurement invariance literature. Organizational Research Methods, 3(1), 4–70.
別名	Rasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch model	Factorial Invariance, Measurement Equivalence, Configural-Metric-Scalar Testing, Ölçüm Değişmezliği
関連	6	3
概要	The short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items.	Measurement invariance testing is a sequence of nested confirmatory factor analysis (CFA) models that examines whether a psychological scale measures the same latent construct in the same way across distinct groups or time points. Systematized and popularized by Vandenberg and Lance (2000), the procedure tests a hierarchy of constraints — from identical factor patterns to identical item intercepts — so that researchers can justify meaningful group comparisons on latent means.