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| 短縮版項目反応理論（SF-IRT）× | 項目応答理論における項目特性曲線（ICC）の差× | |
|---|---|---|
| 分野 | 心理測定学 | 心理測定学 |
| 系統 | Latent structure | Latent structure |
| 提唱年≠ | 1980s–2000s | 1970s–1993 |
| 提唱者≠ | Multiple contributors; IRT adapted to short-form contexts from Lord & Novick (1968) and subsequent applied psychometricians | William H. Angoff and colleagues (ETS); systematized by Holland & Wainer |
| 種類≠ | Latent trait / item calibration model | Item-level bias detection |
| 原典≠ | Embretson, S. E. & Reise, S. P. (2000). Item Response Theory for Psychologists. Lawrence Erlbaum Associates. ISBN: 978-0805828191 | Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589 |
| 別名 | SF-IRT, abbreviated scale IRT, short-form calibration, shortened instrument IRT | DIF, item bias analysis, measurement non-equivalence, item-level measurement bias |
| 関連≠ | 6 | 5 |
| 概要≠ | Short-form item response theory applies IRT calibration and scoring to abbreviated or shortened psychological scales. It uses item information functions to guide which items to retain from a full-length instrument, then estimates latent trait scores from the reduced item set while preserving psychometric rigor and linkage to the full-scale metric. | Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development. |
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