手法を比較

	順序型項目機能差 (Ordinal DIF)	項目応答理論における項目特性曲線（ICC）の差
分野	心理測定学	心理測定学
系統	Latent structure	Latent structure
提唱年	1999-2001	1970s–1993
提唱者	Zumbo (logistic extension) and Penfield (Mantel generalization)	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
種類	Item bias detection for ordered-category items	Item-level bias detection
原典	Zumbo, B. D. (1999). A handbook on the theory and methods of differential item functioning (DIF): Logistic regression modeling as a unitary framework for binary and Likert-type (ordinal) item scores. Ottawa: Directorate of Human Resources Research and Evaluation, Department of National Defense.	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
別名	ordinal DIF, polytomous DIF, DIF for ordered categories, ordinal logistic DIF	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias
関連	6	5
概要	Ordinal differential item functioning analysis detects whether an ordered-category item (such as a Likert-scale question) functions differently across demographic or cultural groups after controlling for the latent trait being measured. It extends classical binary DIF methods to polytomous response formats common in psychological and educational scales.	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.