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項目応答理論における項目特性曲線(ICC)の差×測定不変性テスト×
分野心理測定学心理測定学
系統Latent structureLatent structure
提唱年1970s–19932000
提唱者William H. Angoff and colleagues (ETS); systematized by Holland & WainerVandenberg & Lance
種類Item-level bias detectionMulti-group confirmatory factor analysis procedure
原典Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589Vandenberg, R. J., & Lance, C. E. (2000). A review and synthesis of the measurement invariance literature. Organizational Research Methods, 3(1), 4–70. DOI ↗
別名DIF, item bias analysis, measurement non-equivalence, item-level measurement biasFactorial Invariance, Measurement Equivalence, Configural-Metric-Scalar Testing, Ölçüm Değişmezliği
関連53
概要Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.Measurement invariance testing is a sequence of nested confirmatory factor analysis (CFA) models that examines whether a psychological scale measures the same latent construct in the same way across distinct groups or time points. Systematized and popularized by Vandenberg and Lance (2000), the procedure tests a hierarchy of constraints — from identical factor patterns to identical item intercepts — so that researchers can justify meaningful group comparisons on latent means.
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ScholarGate手法を比較: Differential Item Functioning · Measurement Invariance. 2026-06-18に以下より取得 https://scholargate.app/ja/compare