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	लघु रूप राश मॉडल	विभेदक आइटम कार्यप्रणाली (DIF)
क्षेत्र	मनोमिति	मनोमिति
परिवार	Latent structure	Latent structure
उद्भव वर्ष	1960 (Rasch model); short-form application from 1980s onward	1970s–1993
प्रवर्तक	Georg Rasch	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
प्रकार	Probabilistic item response model	Item-level bias detection
मौलिक स्रोत	Rasch, G. (1960). Probabilistic models for some intelligence and attainment tests. Danmarks Paedagogiske Institut.	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
उपनाम	Rasch analysis for abbreviated scales, short scale Rasch calibration, brief instrument Rasch model	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias
संबंधित	6	5
सारांश	The short form Rasch model applies Rasch measurement theory to abbreviated instrument versions. Rather than using all items from a full scale, researchers select a reduced item set and calibrate it under the Rasch model to verify that the shortened instrument preserves interval-level measurement, adequate person separation, and item fit, enabling efficient yet rigorous measurement with fewer items.	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.