विधियों की तुलना करें

	आंशिक क्रेडिट मॉडल (PCM / GPCM)	विभेदक मद विश्लेषण (Differential Item Functioning - DIF)
क्षेत्र	मनोमिति	मनोमिति
परिवार	Latent structure	Latent structure
उद्भव वर्ष	1982	1988
प्रवर्तक	Geoff N. Masters (PCM, 1982); Eiji Muraki (GPCM, 1992)	Paul W. Holland & Dorothy T. Thayer (Mantel-Haenszel approach, 1988)
प्रकार	Item Response Theory / Polytomous IRT	Item-level fairness / measurement equivalence analysis
मौलिक स्रोत	Masters, G. N. (1982). A Rasch model for partial credit scoring. Psychometrika, 47(2), 149–174.	Holland, P. W. & Thayer, D. T. (1988). Differential Item Performance and the Mantel-Haenszel Procedure. ETS Research Report Series.
उपनाम	Kısmi Kredi Modeli (PCM / GPCM), Generalized Partial Credit Model, GPCM, PCM	Madde Yanlılık Analizi (DIF — Differential Item Functioning), item bias analysis, Mantel-Haenszel DIF, Lord chi-square DIF
संबंधित	5	4
सारांश	The Partial Credit Model is an extension of the Rasch measurement framework designed for ordered polytomous items — items whose responses fall into more than two ordered categories, such as partial-credit tasks in performance assessment or open-ended scoring rubrics. Proposed by Geoff Masters in 1982 and later generalised by Eiji Muraki in 1992, the model estimates a separate threshold (step) parameter for each adjacent-category transition within every item, allowing fine-grained calibration of how much each additional credit level contributes to locating a person on the latent trait.	Differential Item Functioning analysis examines whether examinees from different groups — such as gender, ethnicity, or language background — who have the same underlying ability respond differently to a test item. First formalised by Holland and Thayer in 1988 via the Mantel-Haenszel procedure, it is the principal tool in modern test development for detecting and removing item bias.