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क्रमिक मद विश्लेषण×विभेदक आइटम कार्यप्रणाली (DIF)×
क्षेत्रमनोमितिमनोमिति
परिवारLatent structureLatent structure
उद्भव वर्ष1950s–1980s1970s–1993
प्रवर्तकClassical test theory tradition (Guilford, Nunnally, and others)William H. Angoff and colleagues (ETS); systematized by Holland & Wainer
प्रकारItem-level diagnosticItem-level bias detection
मौलिक स्रोतNunnally, J. C. & Bernstein, I. H. (1994). Psychometric Theory (3rd ed.). McGraw-Hill. ISBN: 978-0070474659Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
उपनामitem analysis for ordinal data, polytomous item analysis, Likert item analysis, OIADIF, item bias analysis, measurement non-equivalence, item-level measurement bias
संबंधित65
सारांशOrdinal item analysis evaluates each individual item in a rating-scale or Likert-type instrument using descriptive and correlational statistics suited to ordered categorical response formats. It guides item selection and refinement by flagging items with problematic difficulty, poor discrimination, or low corrected item-total correlations before reliability and validity studies proceed.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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  3. PUBLISHED

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ScholarGateविधियों की तुलना करें: Ordinal Item Analysis · Differential Item Functioning. 2026-06-17 को यहाँ से प्राप्त https://scholargate.app/hi/compare