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अनुदैर्ध्य मद विश्लेषण×विभेदक आइटम कार्यप्रणाली (DIF)×
क्षेत्रमनोमितिमनोमिति
परिवारLatent structureLatent structure
उद्भव वर्ष1990s–2000s1970s–1993
प्रवर्तकVandenberg, Lance, Meade and colleagues in organizational/educational measurementWilliam H. Angoff and colleagues (ETS); systematized by Holland & Wainer
प्रकारItem-level longitudinal diagnosticItem-level bias detection
मौलिक स्रोतMeade, A. W., Johnson, E. C. & Braddy, P. W. (2008). Power and sensitivity of alternative fit indices in tests of measurement invariance. Journal of Applied Psychology, 93(3), 568–592. DOI ↗Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589
उपनामLIA, repeated-measures item analysis, longitudinal item calibration, item parameter stability analysisDIF, item bias analysis, measurement non-equivalence, item-level measurement bias
संबंधित65
सारांशLongitudinal item analysis examines how the statistical properties of individual scale items — difficulty, discrimination, factor loadings, and fit — remain stable or change systematically across repeated measurement occasions. It is the item-level foundation of longitudinal measurement validity.Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.
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ScholarGateविधियों की तुलना करें: Longitudinal Item Analysis · Differential Item Functioning. 2026-06-17 को यहाँ से प्राप्त https://scholargate.app/hi/compare