विधियों की तुलना करें

	विभेदक आइटम कार्यप्रणाली (DIF)	राश मॉडल
क्षेत्र	मनोमिति	मनोमिति
परिवार	Latent structure	Latent structure
उद्भव वर्ष	1970s–1993	1960
प्रवर्तक	William H. Angoff and colleagues (ETS); systematized by Holland & Wainer	Georg Rasch
प्रकार	Item-level bias detection	Item Response Theory / Latent trait model
मौलिक स्रोत	Holland, P. W. & Wainer, H. (Eds.) (1993). Differential Item Functioning. Lawrence Erlbaum Associates. ISBN: 978-0805809589	Rasch, G. (1960). Probabilistic Models for Some Intelligence and Attainment Tests. Danish Institute for Educational Research, Copenhagen.
उपनाम	DIF, item bias analysis, measurement non-equivalence, item-level measurement bias	1PL IRT, one-parameter logistic model, Rasch Modeli — 1PL IRT, 1PL model
संबंधित	5	6
सारांश	Differential item functioning identifies test or survey items that behave differently for examinees from different groups — such as gender, ethnicity, or language background — after controlling for the underlying ability or trait being measured. DIF analysis is essential for fairness evaluation in educational testing and psychological scale development.	The Rasch model, introduced by Georg Rasch in 1960, is the simplest member of the Item Response Theory (IRT) family. It assigns a single difficulty parameter to each test item and places both item difficulties and person abilities on the same logit scale, enabling direct, sample-independent comparison of items and persons.