विधियों की तुलना करें

	क्रॉस-सेक्शनली ऑगमेंटेड डिकी-फुलर (CADF) टेस्ट	इम-पेसारन-शिन (IPS) पैनल यूनिट-रूट परीक्षण
क्षेत्र	अर्थमिति	अर्थमिति
परिवार	Hypothesis test	Hypothesis test
उद्भव वर्ष	2007	2003
प्रवर्तक	M. Hashem Pesaran	Im, Pesaran & Shin
प्रकार	Panel unit-root test with cross-sectional augmentation	Panel unit-root test allowing cross-sectional heterogeneity
मौलिक स्रोत	Pesaran, M. H. (2007). A simple panel unit root test in the presence of cross-section dependence. Journal of Applied Econometrics, 22(2), 265–312.	Im, K. S., Pesaran, M. H., & Shin, Y. (2003). Testing for unit roots in heterogeneous panels. Journal of Econometrics, 115(1), 53–74.
उपनाम	Cross-Sectionally Augmented ADF, Panel CADF Test, Pesaran Panel Unit Root Test, CADF Birim Kök Testi	IPS Test, IPS Panel Unit-Root Test, Heterogeneous Panel Unit-Root Test, Im-Pesaran-Shin Birim Kök Testi
संबंधित	3	3
सारांश	The Cross-sectionally Augmented Dickey-Fuller (CADF) test, introduced by Pesaran (2007), is a second-generation panel unit-root test designed to handle cross-sectional dependence among panel units. Unlike first-generation panel unit-root tests that assume cross-sectional independence, the CADF test augments individual ADF regressions with cross-sectional averages of lagged levels and first differences, making it suitable for macro-panels and cross-country studies where common factors drive co-movement.	The Im-Pesaran-Shin (IPS) test, introduced by Im, Pesaran, and Shin in 2003, is a panel unit-root test designed for heterogeneous panels where the autoregressive coefficient is allowed to differ across cross-sectional units. It averages individual Augmented Dickey-Fuller (ADF) t-statistics and constructs a standardized statistic with a standard normal limiting distribution, making it one of the most widely applied first-generation panel unit-root tests in applied econometrics.