השוואת שיטות

	ספקטרוסקופיית פוטו-אלקטרונים בקרני רנטגן	פירוק רמן (Raman Deconvolution)
תחום	מדעי החומרים	מדעי החומרים
משפחה	Process / pipeline	Process / pipeline
שנת המקור	1967	1928
הוגה השיטה	Kai Siegbahn	Chandrasekhara Venkata Raman
סוג	Analytical technique	Analytical technique
מקור מכונן	Siegbahn, K., Nordling, C., Fahlman, A., et al. (1967). ESCA: Atomic, Molecular and Solid State Structure Studied by Means of Electron Spectroscopy. Almqvist and Wiksells.	Raman, C. V., & Krishnan, K. S. (1928). The scattering of light by molecules. Nature, 121(3048), 501-502.
כינויים	XPS, ESCA, electron spectroscopy for chemical analysis	Raman deconvolution, Raman peak fitting, spectral analysis
קשורות	3	3
תקציר	X-ray Photoelectron Spectroscopy (XPS), also known as Electron Spectroscopy for Chemical Analysis (ESCA), is a surface-sensitive analytical technique that measures the kinetic energies of photoelectrons ejected from a material by high-energy X-rays. Developed by Kai Siegbahn in 1967, XPS determines elemental composition, chemical oxidation states, and chemical bonding within ~10 nanometers of a surface. It is indispensable in materials science for surface characterization, corrosion studies, oxide analysis, and interface chemistry.	Raman Deconvolution is the mathematical decomposition of experimental Raman spectra into constituent peaks using spectral fitting algorithms. Building on Raman spectroscopy (discovered by C.V. Raman in 1928), Raman deconvolution resolves overlapping vibrational bands into individual component peaks, revealing detailed information about molecular bonds, crystal phases, strain, and defects. This quantitative analysis transforms raw Raman spectra into actionable chemical and structural insights, making it essential for materials characterization, quality control, and scientific discovery.