השוואת שיטות
סקרו את השיטות שבחרתם זו לצד זו; שורות שבהן יש הבדל מודגשות.
| SIBTEST× | מודל DINO× | |
|---|---|---|
| תחום | פסיכומטריה | פסיכומטריה |
| משפחה | Latent structure | Latent structure |
| שנת המקור≠ | 1993 | 2006 |
| הוגה השיטה≠ | Richard Shealy, William F. Stout | James Templin, Russell Henson |
| סוג≠ | Differential item functioning (DIF) assessment | Disjunctive latent class model |
| מקור מכונן≠ | Shealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗ | Templin, J., & Henson, R. A. (2006). Measurement of psychological disorders using cognitive diagnosis models. Psychological Methods, 11(3), 287-305. DOI ↗ |
| כינויים≠ | — | DINO |
| קשורות≠ | 5 | 4 |
| תקציר≠ | SIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability. | The DINO Model (Deterministic Inputs, Noisy Outputs—Disjunctive) is a cognitive diagnostic model that relaxes DINA's conjunctive (AND) skill requirement logic. DINO assumes an examinee only needs to master one of multiple possible skill pathways to answer an item correctly, making it suitable for scenarios where skills are substitutable or alternative routes to success exist. |
| ScholarGateמערך נתונים ↗ |
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