השוואת שיטות

	דיפרקציית אלקטרונים באזור נבחר	ריפוי רייטבלד (Rietveld Refinement) ב-XRD
תחום	מדעי החומרים	מדעי החומרים
משפחה	Process / pipeline	Process / pipeline
שנת המקור	1913	1969
הוגה השיטה	Georges Friedel	Hugo Rietveld
סוג	Diffraction technique	Refinement method
מקור מכונן	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.
כינויים	SAED, electron diffraction pattern, TEM diffraction	Rietveld refinement, powder diffraction refinement
קשורות	3	3
תקציר	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.