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SIBTEST×DINO-malli×
TieteenalaPsykometriikkaPsykometriikka
MenetelmäperheLatent structureLatent structure
Syntyvuosi19932006
KehittäjäRichard Shealy, William F. StoutJames Templin, Russell Henson
TyyppiDifferential item functioning (DIF) assessmentDisjunctive latent class model
AlkuperäislähdeShealy, R., & Stout, W. F. (1993). A model-based standardization approach that separates true bias/DIF from group differences and detects test bias/DTF. Psychometrika, 58(2), 159-194. DOI ↗Templin, J., & Henson, R. A. (2006). Measurement of psychological disorders using cognitive diagnosis models. Psychological Methods, 11(3), 287-305. DOI ↗
RinnakkaisnimetDINO
Liittyvät54
TiivistelmäSIBTEST (Simultaneous Item Bias Test) is a non-parametric method for detecting differential item functioning (DIF) and differential test functioning (DTF) developed by Shealy and Stout (1993). Unlike parametric approaches, SIBTEST does not assume a particular item response model and directly tests whether groups differ in their probability of correct responses at equal levels of overall ability.The DINO Model (Deterministic Inputs, Noisy Outputs—Disjunctive) is a cognitive diagnostic model that relaxes DINA's conjunctive (AND) skill requirement logic. DINO assumes an examinee only needs to master one of multiple possible skill pathways to answer an item correctly, making it suitable for scenarios where skills are substitutable or alternative routes to success exist.
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ScholarGateVertaile menetelmiä: SIBTEST · DINO Model. Haettu 2026-06-17 osoitteesta https://scholargate.app/fi/compare