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| XANES× | ATR-FTIR× | |
|---|---|---|
| Valdkond | Spektroskoopia | Spektroskoopia |
| Perekond | Process / pipeline | Process / pipeline |
| Tekkeaasta≠ | 1975 | 1961 |
| Looja≠ | Peter Lee | Joop Fahrenfort |
| Tüüp≠ | Synchrotron technique | Vibrational spectroscopy technique |
| Algallikas≠ | Lee, P. A., & Pendry, J. B. (1975). Theory of extended x-ray absorption fine structure. Physical Review B, 11(8), 2795-2811. DOI ↗ | Harrick, N. J. (1960). Study of physics of internal reflection from metals. Journal of Physics and Chemistry of Solids, 13(2), 143-155. link ↗ |
| Rööpnimetused≠ | XANES spectroscopy, near-edge X-ray absorption | ATR-IR, attenuated total reflectance, FTIR spectroscopy |
| Seotud | 3 | 3 |
| Kokkuvõte≠ | X-ray Absorption Near Edge Structure (XANES) is a synchrotron X-ray spectroscopy technique that measures the electronic and geometric structure around a specific atom by analyzing the X-ray absorption spectrum within about 50 eV of an absorption edge. Developed by Lee and Pendry in 1975, XANES is complementary to EXAFS and reveals valence state, local symmetry, and unoccupied orbital structure through near-threshold features and resonances. | Attenuated Total Reflectance (ATR) Fourier Transform Infrared (FTIR) spectroscopy is a variant of conventional FTIR that measures infrared absorption through evanescent-wave interrogation of samples in direct contact with a high-refractive-index crystal. Developed by Harrick and Fahrenfort in the 1960s, ATR-FTIR is now the dominant form of FTIR spectroscopy, enabling rapid, non-destructive characterization of organic compounds, polymers, coatings, and biological materials without extensive sample preparation. |
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