Võrdle meetodeid

	EXAFS	XANES
Valdkond	Spektroskoopia	Spektroskoopia
Perekond	Process / pipeline	Process / pipeline
Tekkeaasta	1971	1975
Looja	Edward Stern	Peter Lee
Tüüp	Synchrotron technique	Synchrotron technique
Algallikas	Sayers, D. E., Stern, E. A., & Lytle, F. W. (1971). New technique for investigating noncrystalline structures: Fourier analysis of the extended X-ray absorption fine structure. Physical Review Letters, 27(18), 1204-1207.	Lee, P. A., & Pendry, J. B. (1975). Theory of extended x-ray absorption fine structure. Physical Review B, 11(8), 2795-2811.
Rööpnimetused	EXAFS spectroscopy, X-ray absorption spectroscopy	XANES spectroscopy, near-edge X-ray absorption
Seotud	3	3
Kokkuvõte	Extended X-ray Absorption Fine Structure (EXAFS) is a synchrotron-based X-ray spectroscopy technique that measures the local geometric and electronic structure around a specific atom in any material, crystal or amorphous. Discovered by Sayers, Stern, and Lytle in 1971, EXAFS reveals interatomic distances, coordination numbers, and disorder in the atomic environment by analyzing oscillations in the X-ray absorption spectrum above an absorption edge.	X-ray Absorption Near Edge Structure (XANES) is a synchrotron X-ray spectroscopy technique that measures the electronic and geometric structure around a specific atom by analyzing the X-ray absorption spectrum within about 50 eV of an absorption edge. Developed by Lee and Pendry in 1975, XANES is complementary to EXAFS and reveals valence state, local symmetry, and unoccupied orbital structure through near-threshold features and resonances.