Comparar métodos

	Refinamiento Rietveld de DRX	Difracción de Electrones de Área Seleccionada
Campo	Ciencia de materiales	Ciencia de materiales
Familia	Process / pipeline	Process / pipeline
Año de origen	1969	1913
Autor original	Hugo Rietveld	Georges Friedel
Tipo	Refinement method	Diffraction technique
Fuente seminal	Rietveld, H. M. (1969). A profile refinement method for nuclear and magnetic structures. Journal of Applied Crystallography, 2(2), 65-71.	Williams, D. B., & Carter, C. B. (2009). Transmission Electron Microscopy: A Textbook for Materials Science (2nd ed.). Springer.
Alias	Rietveld refinement, powder diffraction refinement	SAED, electron diffraction pattern, TEM diffraction
Relacionados	3	3
Resumen	XRD Rietveld Refinement is a method for extracting detailed crystal structure information from powder diffraction data by comparing observed and calculated diffraction patterns through least-squares refinement. Developed by Hugo Rietveld in 1969, this technique enables determination of atomic positions, occupancies, thermal parameters, and phase fractions directly from powder data without requiring single crystals. It is the standard approach in materials characterization for structural analysis, phase identification, and quantification.	Selected Area Electron Diffraction (SAED) is a crystallographic technique in transmission electron microscopy that obtains electron diffraction patterns from micron-sized or sub-micron crystalline regions. Developed from fundamental principles of electron wave behavior and integrated into TEM instruments by the mid-20th century, SAED enables direct observation of reciprocal space, crystal symmetry, and defect structures with spatial resolution unattainable by X-ray diffraction. It is essential for studying local crystal structure, phase identification, and characterizing nanoscale materials.